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Methods

X-Ray photoelectron spectroscopy (XPS)
  • Qualitative and quantitative surface analysis. Depth profile analysis on molecular scale without destroying the sample. Determination of the oxidation states of elements. Qualitative and quantitative surface analysis of functional surface groups including structural elucidation.
  • Kryo-XPS, thermo-XPS, imaging XPS in micrometer resolution, small spot XPS.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS)
  • Qualitative surface analysis of functional surface groups and structural elucidation. Analysis of molecular polymer structures and mass of the polymer repeating units. Analysis of polymer end groups, additives, impurities, modifiers, etc., including trace analysis. Imaging of the lateral distribution of molecules in nanometer resolution.

Expertise

Advanced characterization
  • Structural elucidation and evaluation of the reactivity of surfaces, detection and in-situ monitoring of surface reactions, investigations of molecularly ordered surfaces including determination of the degree of coverage.

Contact

Surface Analysis Core Rep.

Frank Simon
351 4658 488