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Digital multiple wavelength refractometer DSR-L

(SCHMIDT + HAENSCH GmbH & Co.)

The DSR is a new refractometer from Schmidt + Haensch featuring a patented multiwavelength source and detector along with Peltier temperature controlled sample holder. The DSR is a microprocessor controlled, critical angle refractometer for measuring the optical density of a wide range of liquid media from low to high viscosity, and independent of opacity and color. The DSR can be programmed to make a series of index measurements automatically with different settings of wavelength, temperature and time interval. The spectroscopic data is aquired at the discrete wavelengths of light sources in the instrument and the data can be plotted and intepolated for the full spectral range.