Fourier Transform (FT-) and AFM-based Mid-Infrared Spectroscopy (MIR)
(MIR with nanolateral resolution
contact mode)
FT-MIR (transmission, reflection), ATR, IRRAS, DRIFT, FT-MIR-Microscopy
- FTIR spectrometer Vertex 70 [Bruker] hyphenated with FTIR microscope Hyperion 2000 [Bruker] equipped with DLaTGS and MCT detector, Rapid Scan option, various reflection methods (single and multiple ATR, DRIFT, IRRAS), programmable heating cells (for kinetics measurements; [Specac, Harrick]), microscope heating stage, on-line flow-cell for GPC(SEC)-FTIR coupling [AABSPEC].
- FTIR spectrometer Vertex 80v (measurements in vacuo; [Bruker]) in a combination with both intergrating sphere [Bruker] and single reflection ATR-Golden Gate unit (room temperature and heated; [Specac]).
- Automatic spectra search in spectral data bases (Hummel polymer spectra library; Bruker-Merck spectra polymer library; Industrial Polymers library; ATR-Complete library etc).
- ATR-IR reaction analysis system REACT-IR4000 [Mettler-Toledo], MCT detector, Si- and Diamond probes for in-situ measurements
- FTIR microscope Spotlight 400 hyphenated with FTIR spectrometer Frontier [Perkin Elmer]: microscope with MCT line-detector (imaging) and MCT single-detector, spectrometer with LiTaO3 MIR detector, operating modes: single spectra/spectral imaging in transmission, reflection, micro-ATR, visual autofocus, internal particle analysis software
Accessories
RT - 700°C; ramp rate 0.5 - 30°C/min
“Praying Mantis” (Harrick) for
measurements of thin modification layers on powder surface
(Diamond, Ge, Si, KRS-5, ZnSe crystals)
measurements of thin layers, up to 300 nm and monolayers (ATR-Si-Wafer unit))
s-/p- spectra's acquisition
ca. 400 ms, 4 scans
RT - 400°C; ramp rate 0.5 - 10°C/min
(measurements of organic monolayers)
motorized rotator for polarizers
(measurements of organic monolayers)