ORCID: 0000-0001-9188-1293

Member of the Research Group Atomic Force Microscopy

Fields of work

My work uses cutting-edge AFM technology to investigate and analyse various samples at nanoscale level by different high-performance AFM systems, like Bruker Fastscan, Bruker Icon, Bruker Dimension V, Bruker Multimode.

• High-resolution Imaging for quantitative structure, roughness and height measurement of surface morphology and feature
• Mechanical measurements at the nanoscale using AFM-based techniques, e.g. QNM
• Other material properties, like distribution of electrical charges, surface potential, electric conductivity
• In-situ AFM

Service measurements for IPF, training of Postdocs/PhD/Master students in AFM.