Equipment

Contact Angle Measuring

Contact Angle Measuring Equipment OCA 40 Micro
(Dataphysics, Filderstadt, Germany)

Fully automated measuring instrument for the analysis of the wetting behaviour of microscopic and macroscopic structure.

Measuring lens with 55-fold zoom (optional 137.5-fold) and software controlled, motorized, focus and adjustment of the observation angle
Software controlled dosing needle/ head positioning
Temperature control / measurement

For further information please contact:
Alexander Münch

Winkler Dataphysics Contact Angle Measuring

Ellipsometry

Ellipsometer SE 402
(Sentech Instruments GmbH, Berlin)

The ellipsometer delivers information about the surface modification (thickness) of substrates

red He-Ne laser with a wavelength 632.8 nm is used
incident angle of the laser measures at 70°
After the sample surface is reached, the reflected light passes through the analyzer and drops onto a photo multiplier, which operates as a detector
The control of the ellipsometer and the data evaluation requires special software

For further information please contact:
Alexander Münch

Null-Ellipsometer Multiscope
(Optrel, Berlin)

Accuracy Δ±0.005°, Ψ±0.005°
Information about layers growth (ex- or in-situ) and optical properties of the samples can be derived, using the ellipsometry method.
Surface modification
Swelling phenomena
"in situ" monitoring of adsorption processes at interfaces
Red He-Ne laser with a wavelenght 632.8 nm is used

Dual Rotating Compensator Ellipsometer RC2-D
(Woolam Co.)

wavelength 193 bis 1000 nm

For further information please contact:
Petra Uhlmann

Fluorescence Microscopy

Fluorescence Microscope Axio Imager.A1m
(Carl Zeiss Jena GmbH)

microscopy in reflection mode as well as standard light microscopy,
Mercury short arc lamp for fluorescence microscopy; Halogen lamps for light microscopy
SPOT Insight camera and single photon sensitive camera (CASCADE II 512) for low intensity fluorescence signals and monitoring of fast processes,
LTS 350 heating / freezing stage,
objectives: 5x, 10x Epiplan HD; 20x, 50x, 100x LD-EC Epiplan-Neofluar HD DIC

For further information please contact:
Alexander Münch

Fluorescence Microscope DMi8
(Leica Microsystems)

For further information please contact:
Julian Thiele

Optical Spectroscopy

Cary 5000 UV-Vis-NIR
(Agilent Technologies Inc.)

Light Source: Tungsten halogen visible and deuterium arc UV
Maximum Scanning Speed: UV-Vis 2,000 nm/min NIR 8,000 nm/min
Photometric System: Double beam
Spectral Bandwidth: UV-Vis 0.01 - 5.00 nm, NIR 0.04 - 20 nm
Wavelength 175 - 3300 nm
Width 1020 mm Z-height 20 mm

FT-IR Spectrometer VERTEX 70
(Bruker Corporation)

For further information please contact:
Alexander Münch

Electrochemical Analysis

Potentiostat/ Galvanostat PGSTAT 100
Metrohm Autolab

Current: Maximum output current: ± 250 mA, Range: 10 nA 100 mA, Accuracy: ±0.2 % of current + 0.2 % of current range)
Voltage: Maximum output voltage: ± 100 V, Range: ± 10 V, Accuracy: ± 0.2 % of setting/ ± 2 mV
Size: 520 mm (L) x 400 mm (W) x 166 mm (H)

PGSTAT100 is a modular high voltage potentiostat/galvanostat, especially suited for experimetns with low conductivity. Different electrochemical techniques can be used, e.g. standard cyclic voltammetry, AC voltammetry and constant current potentiostatic stripping analysis.

For further information please contact:
Olga Grätz

Climate Chamber

Climate chamber Type WK3-1000/70
Weiss Umwelttechnik GmbH/ Simulationsanlagen Messtechnik

Accurate temperature and climate conditions to regulated air flow are ensured
Special program/software for the analysis of the measuring data is available
Tele-control via Intranet or Internet is possible
Aditional setup for Ice-adhesion measurement (Measurement of the adhesion force of an ice droplet by using the radial force applied by a spin coater)
Additional setup for Frost-formation measurement (Determination of frost layer thickness by focus point shifts)

For further information please contact:
René Winkler